Cell Testing Machine hmanga thil tih a ni

Cell Testing Machine hmanga thil tih a ni

He OCV (Open Circuit Voltage) leh IR (Internal Resistance) Tester hi battery cell quality screening chak tak, tichhe thei lo tura siam, precision instrument a ni.
Inquiry thawn rawh .
Hrilhfiahna

He OCV (Open Circuit Voltage) leh IR (Internal Resistance) Tester hi battery cell quality screening chak tak, tichhe thei lo tura siam, precision instrument a ni. A tehna pawimawh tak pahnih a ti a, chungte chu charge leh cell hriselna dinhmun tehna atan static Open Circuit Voltage a ni a, DC Internal Resistance, a tlangpuiin DC load method hmanga power capability leh connection integrity tehna atan te a ni.

 

High-speed measurement (second chhungin a tam zawk), millivolt-level voltage accuracy, leh milliohm-level resistance resolution te a nei a, he bench-top or in-line tester hi production line-a 100% inspection atan a pawimawh hle. He OCV cell testing machine hian voltage abnormalities emaw internal resistance sang tak nei cell chhia te chu formation emaw grading emaw hmain effective takin a hmuchhuak a, batch consistency a tichiang a ni. A stable, repeatable measurement leh data logging theihna te hi battery sorting tha tak leh manufacturing leh quality control laboratory-a pack assembly rintlak tak neih nan a pawimawh hle.

 

Specifications leh A hmanna tur huam chin

 

16001

lenzawng tehna

A inmil theihna range

Cell san zawng (H) 1.1.

118~210mm a ni

Cell zau zawng (W) .

130~173mm a ni

Cell thuk zawng (T) 1.1.

36~72mm a ni

 

 

Device Composition awm dan

 

He device hi thil pathum a awm a, chungte chu scanning system, test fixture leh OCV testing system te an ni.

Scan Code System hmanga siam a ni

Cell chu manual in scan rawh.

Scan zawhah cell data chu host computer software ah upload rawh.


Robot arm system chu test rawh

Test fixture hi lifting mechanism, test probe mechanism leh cell positioning mechanism te a ni.

QR code scanning zawh hnuah positioning mechanism chuan battery cell chu a position ang. Positioning a zawh chuan test robot arm chu probe mechanism nen a chhuk ang a, battery cell-ah Open-Circuit Voltage (OCV) test a ti ang.

Test pressing hian cylinder method a hmang a.

 

OCV Test System hmanga enfiah a ni

He system hian test instrument leh test cable te a huam a ni.

 

Thil hmanrua hman dan tur

product-954-48

 

Zir thlen chin

 

hmanrua siam dan (structure) a ni

order number a ni

ruahmanna

technical parameter hmanga teh a ni

1

Device channel chhiar zat

Test khatah battery 1 test thin ang che

2

Machine rawng rawng

Standard warm 1C (a duh angin a siam theih) .

3

hnathawk power supply a ni

AC220V±10% pathum-phase panga-wire, 50HZ

4

hnathawhna hmun

A chhehvel boruak lum leh vawt: 10-40℃; relative humidity: 60% aia tlem emaw, a tlukpui emaw

5

Hnathawh boruak chhuahna

0.5-0.8MPa a ni

6

plant theihna tur a ni

1.0KW aia tlem emaw, a tlukpui emaw a ni

7

hmanrua rit zawng

500kg aia tlem emaw, a tlukpui emaw a ni

Testing organization a ni

order number a ni

ruahmanna

technical parameter hmanga teh a ni

1

probe a ni

Current needle chu serrated a ni a, a lu chu gold-plated a ni a, hei hian current passing leh voltage sampling dik tak a enfiah thei a ni

2

Probe press zat a awm

A let 20,000 aia tam emaw, a tlukpui emaw

3

Probe contact resistance a awm thei

5mΩ aia tlem emaw, a tlukpui emaw a ni

OCV system hmanga siam a ni

order number a ni

ruahmanna

technical parameter hmanga teh a ni

1

test cable hmanga enfiah a ni

twisted shielded pahnih a awm

2

test instrumentation hmanga enfiah a ni

Nisa

3

Voltage test dik tak a ni

±(0.0035% set+0.0005% FS) a ni.

4

Voltage resolution a ni

10μV

5

Internal resistance test theihna hmun a ni

0-3mΩ

6

Chhungril lama invenna test

±0.5%rdg.±10dgt a ni

7

Chhungril lama dodalna resolution

0.1μΩ

8

GRR

10% aia tlem emaw, a tlukpui emaw .

9

Zero plate a ni

‘Gong’ character-shaped design [BT3562-a First Edition (A980-00)-a Nippon Electric Co., Ltd., Appendix 12-a tarlan angin, 9454-a zero-adjustment principle chipchiar taka tarlanna

10

A chhunga resistance master block

Standard resistance value chu 25 mΩ ± 0.5 mΩ a ni

11

Local monitoring computer hmanga enkawl a ni

Configuration mamawh (Party A-in a pek):

Operating system: Windows 10 emaw a hnuai lam emaw

Chinese version tawng: Chinese tawng awlsam zawk

CPU: Intel Core i7 emaw a chunglam emaw a ni

Memory: 12GB aia tam a ni

Hard disk: 1TB emaw a aia tam emaw

Display: LCD display inches 19 aia tam a ni

hot tags .: cell testing machine, China cell testing machine siamtu, supplier, factory